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Keysight Spring 2017 AFM webinars

2017-03-16

Join Us Online for New, 30-Minute AFM Seminars! 

Scientific Atomic Force Microscopy | Spring 2017 | Keysight Technologies

 

It might almost seem to be a contradiction, but even though our new Express e-Seminars are fast and free the helpful content they provide has truly long-lasting value. These live "how-to" events will focus on many important practical aspects of atomic force microscopy (AFM), including various sample sources, immobilization methods, cleaning procedures, choice of cantilever, scanner, imaging modes and imaging parameters.

Keysight senior application scientist Dr. Song Xu has created this engaging series of brief scientific presentations as a means of sharing essential AFM know-how. All online attendees are encouraged to interact directly with Dr. Xu during open Q&A.

Register now to join us for one or more of these upcoming Express e-Seminars!  

Date:                      March 28 @ 11:00 a.m. ET

Lecturer:              Song Xu, Ph.D. (Keysight Technologies)

Title:                     It's a Calibration Celebration!

In this session, we will work with four standard samples in the context of instrument test and calibration: (1) gratings to calibrate AFM imaging, (2) mica to test AFM atomic resolution on atomic lattice, (3) HOPG to test STM atomic resolution, and (4) series of standard silicon rubber samples to calibrate AFM indentation for measurement of nanomechanical properties.

Date:                      April 11 @ 11:00 a.m. ET

Lecturer:              Song Xu, Ph.D. (Keysight Technologies)

Title:                     How Well Do You Know Your Nano?   


This session will be dedicated to learning highly useful preparation techniques for samples such as nanotubes and nanoparticles in order to optimize AFM investigations of surface structures, mechanical properties, local electrical properties, etc.

Date:                      April 25@ 11:00 a.m. ET

Lecturer:              Song Xu, Ph.D. (Keysight Technologies)

Title:                     Higher-Order Thinking: Crystals 

 

  We will concentrate on crystal materials in this session, including metal, salt and mineral. Examples includes gold (111) single-crystal sample, both commercial and lab made, calcite crystal, silicon wafer, copper sample for conductivity imaging. We will pay particular attention to the preparation of these samples for AFM studies of topography, structure, and electrical conductivity imaging.

Date:                      May 2 @ 11:00 a.m. ET

Lecturer:              Song Xu, Ph.D. (Keysight Technologies)

Title:                     Put the Pedal to the Metal! 

In this session, we will focus on the sample preparation of observing in-situ formation of coatings, including metal thin films formed by electroplating and organic monolayer formation. This is not just a topic of sample preparation, but the preparation step for in-situ experiments. In session, we will show the details of step by step how to prepare samples for in-situ electrochemistry experiment with electrochemistry and organic solvent cell.

Date:                      May 9 @ 11:00 a.m. ET

Lecturer:              Song Xu, Ph.D. (Keysight Technologies

Title:                     Handle with Care: Soft Materials 

This session will cover critical protocols for dealing with soft materials such as polymers, hydrogels, and silicon rubber, and we will pay special attention of how to prepare soft sample in fluid for imaging and indentation, using Keysight's patented MAC Mode, as well as other imaging and measurement modes. For very soft samples, we will also show the preparation of the tips before imaging.

Join us for one or more of these unique live events!

 

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