X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent)  X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials and for research in geochemistry, forensic science and archaeology.

Sub categories

Micro-XRF Analysis (XGT)